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The GX71 inverted microscope remains one of the most sought-after core research metallographs in use today. Capable of numerous image forming techniques with UIS2 objectives, the GX71 is the workhorse that will provide years of reliability.


Easy and Comfortable to Use with a Variety of Image Forming Techniques

GX71 Microscope Image Forming Mirror Turret
Image Forming Mirror Turret
To handle the diversity of incoming samples and their unique analysis requirements the GX71 implements the largest variety of image forming techniques of all the Olympus inverted metallographs. Brightfield, darkfield, DIC, simple polarization, and fluorescence are available for spot-on investigations. Housed in a dust free turret a selection of mirror cubes can be conveniently and quickly rotated from one position to another.

Built-In Magnification Changer

Continuous zoom or selectable increments allow images to be viewed at higher magnifications for added inspection versatility and/or required test and inspection standards.

GX71 Magnification Changer Switch
Magnification Changer
GX71 Zoom In/Out Function result example
Zoom In/Out Function

Super Widefield Observation

GX71 26.5mm Viewfield Compatible Observation Tubes U-SWTR-3 U-SWB130
26.5mm Viewfield Compatible Observation Tubes
Scan large areas for sample integrity, or defects and irregularities with the 26.5mm view-field offered with the GX-71 system.

Enhanced Efficiency Through Motorization

The use of motorized components can save time and cut costs when large quantities of samples require analysis. A single handset is available to quickly control the rotation of objectives. For higher levels of speed and analysis, Stream Image Analysis Software will manage additional components such as the motorized filter wheel and automated scanning stages.

GX71 Motorized Components and PC control diagram
Motorized Components and PC control

Excellent Image Clarity and Superb Resolution

Variety of Choices for Superior Imaging Performance

UIS2 optics delivers bright, sharp, high-resolution images suitable for all observation methods: brightfield, darkfield, differential interference contrast, polarization, and fluorescence. Designed with specific wave front aberration controls and specialty coatings for color fidelity, UIS2 optics ensure images are true to form and highly resolved.

Example Observation Images
Brightfield BF microscope observation
Darkfield DF microscope observation
Differential Interference Contrast DIC microscope observation
Simple Polarization microscope observation
Simple Polarization
Fluorescence microscope observation
Diverse Lineup Allows Selections According to the Purpose
MPLAPONPlan Apochromat Objective Lens Series
MPLFLNSemi Apochromat Objective Lens Series for Brightfield
MPLFLN-BDSemi Apochromat Objective Lens Series for Brightfield and Darkfield
MPLFLN-BDPSemi Apochromat Objective Lens Series for Brightfield and Darkfield
LMPLFLNLong WD Semi Apochromat Objective Lens Series for Brightfield
LMPLFLN-BDLong WD Semi Apochromat Objective Lens Series for Brightfield and Darkfield
MPLNPlan Achromat Objective Lens Series for Brightfield
MPLN-BDPlan Achromat Objective Lens Series for both Brightfield and Darkfield
SLMPLNSuper Long WD Plan Achromat Objective Lens Series
LCPLFLN-LCDLong WD Semi Apocromatic Objective Lens Series for LCD

> Click here for details about UIS2 objective lenses

Software Solution

Built to Easily Work with Digital Cameras and Image Analysis Software

Our full line of digital cameras provide high resolution viewing and fast image transfer while our advanced OLYMPUS Image Analysis Software empowers users and provides all the tools required for today's most complex metallurgical requirements. Choose from Extended Measurements, StandardMetallography and Advanced Metallography application specific modules (over a dozen application specific routines) and automatically populate data and create reports in compliance with the most popular ASTM and ISO specifications, all with just a few clicks of the mouse.

> Click here for the Olympus' lineup of digital cameras 
> Click here for the Olympus' lineup of software options


Transmitted Light Illuminator

A transmitted light illuminator can be attached to the back of the microscope body, enabling observation of transparent specimens and powders.

Передовые решения неразрушающего контроля

Контроль сварных соединений Коррозионный мониторинг Технология направленных волн Aerospace Inspection Solutions Stress Corrosion Cracking Solutions Контроль композитных материалов Промышленные сканеры Экспресс-диагностика трубопроводов


Портативные ультразвуковые дефектоскопы Вихретоковые дефектоскопы Оборудование с фазированными решётками BondTesting Матричные вихретоковые дефектоскопы Технология направленных волн Генераторы-приёмники Датчики и преобразователи

Интегрированные системные решения в области НК

Контрольно-измерительные системы
Системы диагностики прутков Системы диагностики трубопроводов


Преобразователи и комплектующие

Компоненты микроскопов

Modular Microscope Assemblies Optical Microscope Frames Optical Microscope Modules

Оптические измерительные системы

Лазерные конфокальные микроскопы Опто-цифровые микроскопы

Видеоскопы, бороскопы

Видеоскопы Промышленные фиброскопы Стандартные жёсткие бороскопы Программное обеспечение для генерации отчетов Источники света Системы прокрутки

Высокоскоростные видеокамеры

Анализаторы XRF и XRD

Настольные XRD/XRF анализаторы
Переносной XRF-анализатор Портативный XRF-анализатор DELTA Портативный дифрактометр (XRD) Промышленный XRF-анализатор Тестовый стенд XRF


Semiconductor & Flat Panel Display Inspection Инвертированные металлургические микроскопы Лазерные конфокальные микроскопы Модульные микроскопы Объективы Опто-цифровые микроскопы Поляризационные микроскопы Программное обеспечение для анализа изображений Прямые металлургические микроскопы Стерео микроскопы Цифровые камеры

Применение НК