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BX51P

The BX51P polarizing microscope is an investigative tool for the identification of isotropic and anisotropic materials, forensic analysis, thin film/polymer/crystal identification, and extraneous particulates.
   

Описание:

Clear Observation Images with UIS2 Objective Lens


Thanks to Olympus' sophisticated design and manufacturing technology, new ACHN-P and UPLFLN-P strain-free objectives reduce internal strain to an absolute minimum. Olympus has also totally redesigned its polarizers and polarizing condensers to further enhance performance in polarized light. This means a higher EF* value, resulting in unmatched image brightness and contrast.

*EF value: the ratio of brightness of parallel Nicols to orthogonal(Cross) Nicols. The higher is the EF value, the less is the strain of the optical system. This means that a higher EF value is superior in polarization characteristics.

Example Observation Images
Polarized Observation of Quartz Diorite
Quartz Diorite
Polarized Observation of Liquid Crystal MBBA (P-methoxy Benzylidene P-n Butyl Aniline)
Liquid Crystal MBBA (P-methoxy Benzylidene P-n Butyl Aniline)
UPLFLN-P Series Polarizing Microscope Objective Lenses
UPLFLN-P Series
UPLFLN-P Series Specifications
Product NameNumerical Aperture 
(N.A.)
Working Distance 
(W.D.)
UPLFLN4XP0.1317.0mm
UPLFLN10XP0.310.0mm
UPLFLN20XP0.52.1mm
UPLFLN40XP0.750.51mm
UPLFLN100XOP1.30.2mm
ACHN-P Series Polarizing Microscope Objective Lenses
ACHN-P Series
ACHN-P Series Specifications
Product NameNumerical Aperture 
(N.A.)
Working Distance 
(W.D.)
ACHN10xP0.256.0mm
ACHN20xP0.403.0mm
ACHN40xP0.650.45mm
ACHN100xOP1.250.13mm

Superior Operability and Optical Performance


Large Viewfields and Ergonomic Design

Observations can be performed comfortably and efficiently thanks to the Y-shape frame developed in pursuit of ultimate ergonomics. This greatly lessens operator's fatigue during the extended observation. 
The Field Number is as large as 22, allowing a 21% wider area than that given by a microscope of ordinary filed number 20 to be observed at a glance. In addition, a bright halogen lamp of 12V-100W is used in the illumination system allowing observation of clear images of polarization.


Rugged and Accurate Rotating Stage

The rotating-centering mechanism attached to the rotary stage allows smooth rotation of a specimen. In addition, there is a click-stop mechanism provided at each 45 degrees for precise measurement. With the option of adding a dual-mechanical stage further discreet x-y movement is possible.

Rotary Stage
Rotary Stage
Dual-mechanical Stage U-FMP
Dual-mechanical Stage

Accessories Suited for High-level Polarization Observation


Compensators

WavePlate/Compensator
WavePlate/Compensator
Six different compensators are available for the BX51-P microscope, allowing measurement of various retardation levels, ranging from 0 to 20λ. For easier measurement, the direct readout method is featured. Higher image contrast can be attained by using a Senarmont or Brace- Koehler compensator to change the retardation level in the entire field of view.
Retardation Measuring range of compensators
CompensatorMeasuring RangeMajor Application
U-CTB Thick Berek0-11,000nmLarge Retardation Measurement (R*>3λ), ( Crystal , Giant Molecule, Fiber, Photoelastic Strain, etc.)
U-CBE Berek0-1,640nmRetardation Measurement ( Crystal , Giant Molecule, Fiber, Body Tissue, etc.)
U-CSE Senarmont0-546nmRetardation Measurement ( Crystal , Body Tissue, etc.) 
Contrast Intensification (Body Tissue, etc.)
U-CBR1 Brace-Kohler 1/10λ0-55nmMinute Retardation Measurement ( Crystal , Body Tissue, etc.) 
Contrast Intensification (Body Tissue, etc.)
U-CBR2 Brace-Kohler 1/30λ0-20nm
U-CWE2 Quarts Wedge500-2,200nmPreliminary Survey of Retardation ( Crystal , Giant Molecule, etc.)

* R stands for retardation. 
The use of an interference filter 45IF546 together is recommended for improving measuring accuracy (Except for U-CWE2).


Unmatched image sharpness in orthoscopic and conoscopic observations.

Conoscopic Orthoscope Observation Units
Conoscopic Orthoscope Observation Units
With a U-CPA conoscopic observation attachment, changeover between orthoscopic and conoscopic observation is simple and quick. 
Focusing of conoscopic images is easy and accurate. Employing a Bertrand field stop makes it possible to obtain consistently sharp and clear conoscopic images

Easy adaptation of digital cameras, image analysis software and automated accessories

Our full line of digital cameras provide viewing and speedy image transfer to computers. OLYMPUS Image Analysis Software has been designed specifically for industrial microscopy applications with intuitive menus and advanced software routines. Users are empowered with the latest image analysis and management solutions to satisfy specific application requirements.


Передовые решения неразрушающего контроля

Контроль сварных соединений Коррозионный мониторинг Технология направленных волн Aerospace Inspection Solutions Stress Corrosion Cracking Solutions Контроль композитных материалов Промышленные сканеры Экспресс-диагностика трубопроводов

Дефектоскопы

Портативные ультразвуковые дефектоскопы Вихретоковые дефектоскопы Оборудование с фазированными решётками BondTesting Матричные вихретоковые дефектоскопы Технология направленных волн Генераторы-приёмники Датчики и преобразователи

Интегрированные системные решения в области НК

Контрольно-измерительные системы
Системы диагностики прутков Системы диагностики трубопроводов

Толщиномеры

Преобразователи и комплектующие

Компоненты микроскопов

Modular Microscope Assemblies Optical Microscope Frames Optical Microscope Modules

Оптические измерительные системы

Лазерные конфокальные микроскопы Опто-цифровые микроскопы

Видеоскопы, бороскопы

Видеоскопы Промышленные фиброскопы Стандартные жёсткие бороскопы Программное обеспечение для генерации отчетов Источники света Системы прокрутки

Высокоскоростные видеокамеры

Анализаторы XRF и XRD

Настольные XRD/XRF анализаторы
Переносной XRF-анализатор Портативный XRF-анализатор DELTA Портативный дифрактометр (XRD) Промышленный XRF-анализатор Тестовый стенд XRF

Микроскопия

Semiconductor & Flat Panel Display Inspection Инвертированные металлургические микроскопы Лазерные конфокальные микроскопы Модульные микроскопы Объективы Опто-цифровые микроскопы Поляризационные микроскопы Программное обеспечение для анализа изображений Прямые металлургические микроскопы Стерео микроскопы Цифровые камеры

Применение НК

Техподдержка