Semiconductor & Flat Panel Display Inspection
MX-IR / BX-IR
These IR Imaging Systems contain dedicated IR objective lenses and components that are corrected for chromatic aberrations and designed for 700-1300nm wavelengths.
The Olympus MX51 industrial inspection microscope is cost-effective and optimized for the inspection requirements of a variety of electronic components, wafers and large samples.
The MX61L/ MX61, 300 mm/ 200 mm semiconductor inspection microscope provides exceptional image resolution and clarity through observation methods such as brightfield, darkfield, differential interference contrast (DIC), fluorescence and infrared.
The MX61A is a specially designed semiconductor microscope that allows operators to work in an ergonomically correct position and benefit from smoother operation throughout extended inspection periods, maximizing productivity and integration.