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The MX61A is a specially designed semiconductor microscope that allows operators to work in an ergonomically correct position and benefit from smoother operation throughout extended inspection periods, maximizing productivity and integration.


High-level Imaging Performance

The best in imaging performance has been improved through the introduction of the new UIS2 optical system employed by the MX61A. Clear, crisp, true color images are evident in all illumination techniques including brightfield, darkfield and differential interference contrast (DIC). The MX61A's darkfield observation image brightness has increased by an average of four times as compared with the previous Olympus UIS optical series.

Example Observation Images
Brightfield Microscope Observation
New Darkfield Microscope Observation
New Darkfield
Conventional Darkfield Microscope Observation

> Click here for details about UIS2 objective lenses

Optimized Contrast by Automatic Aperture Control

MX61a microscope with Aperture Stop Control
Aperture Stop Control
The integrated motorized aperture stop automatically adjusts for the objective lens in use. Thus the best image quality for every magnification is achieved, making routine inspections more comfortable for the eyes and more efficient for the operator.

Active Laser Autofocus

MX61a microscope with Laser autofocus objective lenses
Autofocus with High-magnification Lenses
The MX61A is equipped with an active laser auto focus unit that improves the accuracy and speed of inspections. The introduction of a newly developed multi-spot sensor enables a substantial increase in stability by eliminating the effects of vertical topography on the specimen, exceeds expectations in all observation methods, even faster and more repeatable.

Supports Routine and Advanced Observation Methods

Objective Lens UIS2 Series
Objective Lens UIS2 Series
The UIS2 objective lens series provides high performance imaging in deep ultraviolet, visible light and near-infrared microscopy. The MX61A is compatible with all UIS2 objectives making Brightfield, Darkfield, Differential Interference Contrast, Fluorescence and Near-Infrared observations available on one system easily selected through the integrated software platform or handset. 
> Click here for details about UIS2 objective lenses
Example Observation Images
Brightfield BF microscope observation
Darkfield DF microscope observation
Differential Interference Contrast DIC microscope observation
Differential Interference Contrast
Fluorescence microscope observation
Comparison between Near-infrared Light (left) and Visible Light (right)
Comparison between Near-infrared Light (left) and Visible Light (right)

Integrated Control of Motorized Components

Integrated Control of Motorized Components

MX61a Integrated Microscope and Software System
Integrated Microscope and Software System
Olympus offers several software platforms that fully integrate with the MX61A microscope frame to control all motorized functions including the digital camera and motorized stage. Each interface is specifically designed for basic inspection and control, advanced image analysis or repetitive site inspection and defect review. 

> Click here for Olympus' lineup of digital cameras 
> Click here for Olympus' lineup of software options

Ergonomic Design Features

Compliant with SEMI S2 & S8 Standards

The MX61A is manufactured in accordance to SEMI (Semiconductor Equipment and Materials International) S2 and S8 standards for wafer safety and ergonomics and is also CE marked.

Tilting Observation Tube

MX-SWETTR Tilting Microsopic Observation Tube
Tilting Observation Tube
The extensive range of the tilting observation tube allows the operator to sit at the microscope using the proper posture ensuring reliable and comfortable operation.

Increased Inspection Speed with Motorized Nosepieces

Increased Microscope Inspection Speed through the Motorized Nosepieces U-D6BDREMC and U-P5BDREMC
Motorized Nosepieces
The rotational speed of the motorized nosepiece ultra-fast, decreasing time between inspections while maintaining clean room compatibility. Olympus offers three variations for desired inspection methods controlled via software, frame button or independent handset.

Rigid Frame Design

High-magnification Observation Image
High-magnification Observation Image
Olympus has adopted a highly rigid, vibration-sensitive design to its MX61A frame in order to minimize blurring due to vibration, maximizing the image resolution and contrast, beneficial when using 100x or 150x objective lenses.

Handset for Tactile Control

MX handset microscope function controller
An ergonomically designed handset allows push-button control for the motorized funtions of the microscope such as selecting the objective lens and observation techniques. The operator can also switch between TRACE and ONE SHOT control of the auto focus unit, manually fine focus, adjust the retardation position in DIC, lamp intensity and lower the stage for sample exchange.

Complimentary Inspection Solutions

Wafer Handler Solution

AL120 Wafer Loader Combination MX61
Wafer Loader Combination
The MX61A frame interfaces seamlessly with the Olympus AL120 wafer handlers. The Olympus wafer loader series transfers both silicon and compound semiconductor wafers of multiple sizes from the cassette to the microscopes stage, while maintaining an ergonomic design. Compliant with both S2 and S8 standards, the AL120 can be programmed for up to ten system configurations including specific cassette types, wafer specifications and transfer speed. Quick push button recipe selection allows the operator to load different products instantly. Non-contact optical centering, notch/flat detection and alignment reduces wafer contact, improving cleanliness.

Continuing with world-renowned performance and reliability of previous Olympus wafer handlers, the AL120 now transfers wafers with thicknesses as small as 90μm to specifically meet the demands of thin wafer manufacturers.

High Performance Motorized Stages

MX61a with motorized stage option
Motorized Stage
Highly accurate motorized stages are available with the MX61A microscope. Motorized stages with joystick and software controls make inspections repeatable and ergonomic for extended inspection times.

Передовые решения неразрушающего контроля

Контроль сварных соединений Коррозионный мониторинг Технология направленных волн Aerospace Inspection Solutions Stress Corrosion Cracking Solutions Контроль композитных материалов Промышленные сканеры Экспресс-диагностика трубопроводов


Портативные ультразвуковые дефектоскопы Вихретоковые дефектоскопы Оборудование с фазированными решётками BondTesting Матричные вихретоковые дефектоскопы Технология направленных волн Генераторы-приёмники Датчики и преобразователи

Интегрированные системные решения в области НК

Контрольно-измерительные системы
Системы диагностики прутков Системы диагностики трубопроводов


Преобразователи и комплектующие

Компоненты микроскопов

Modular Microscope Assemblies Optical Microscope Frames Optical Microscope Modules

Оптические измерительные системы

Лазерные конфокальные микроскопы Опто-цифровые микроскопы

Видеоскопы, бороскопы

Видеоскопы Промышленные фиброскопы Стандартные жёсткие бороскопы Программное обеспечение для генерации отчетов Источники света Системы прокрутки

Высокоскоростные видеокамеры

Анализаторы XRF и XRD

Настольные XRD/XRF анализаторы
Переносной XRF-анализатор Портативный XRF-анализатор DELTA Портативный дифрактометр (XRD) Промышленный XRF-анализатор Тестовый стенд XRF


Semiconductor & Flat Panel Display Inspection Инвертированные металлургические микроскопы Лазерные конфокальные микроскопы Модульные микроскопы Объективы Опто-цифровые микроскопы Поляризационные микроскопы Программное обеспечение для анализа изображений Прямые металлургические микроскопы Стерео микроскопы Цифровые камеры

Применение НК